Charalabos A Dimitriadis: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

1

A new threshold-voltage compensation technique of poly-Si TFTs for AMOLED display pixel circuits

Ilias Pappas, Stylianos Siskos, Charalabos A. Dimitriadis

Journal:

Journal of the Society for Information Display

Year:

2010

Language:

english

File:

PDF, 1.62 MB

english, 2010

2

Dynamic variability in 14nm FD-SOI MOSFETs and transient simulation methodology

Theodorou, Christoforos G., Ioannidis, Eleftherios G., Haendler, Sebastien, Dimitriadis, Charalabos A., Ghibaudo, Gerard

Journal:

Solid-State Electronics

Year:

2015

Language:

english

File:

PDF, 841 KB

english, 2015

3

Effect of Temperature on the Performance of Triple-Gate Junctionless Transistors

Oproglidis, Theodoros A., Karatsori, Theano A., Barraud, Sylvain, Ghibaudo, Gerard, Dimitriadis, Charalabos A.

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 1.02 MB

english, 2018

4

[IEEE ESSDERC 2012 - 42nd European Solid State Device Research Conference - Bordeaux, France (2012.09.17-2012.09.21)] 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Impact of front-back gate coupling on low frequency noise in 28 nm FDSOI MOSFETs

Theodorou, Christoforos G., Ioannidis, Eleftherios G., Haendler, Sebastien, Planes, Nicolas, Arnaud, Franck, Jomaah, Jalal, Dimitriadis, Charalabos A., Ghibaudo, Gerard

Year:

2012

Language:

english

File:

PDF, 1.95 MB

english, 2012

5

Origin of low frequency noise in polycrystalline silicon thin-film transistors

Charalabos A. Dimitriadis, Jean Brini, George Kamarinos

Journal:

Thin Solid Films

Year:

2003

Language:

english

File:

PDF, 93 KB

english, 2003

6

Study of Hot-Carrier-Induced Traps in Nanoscale UTBB FD-SOI MOSFETs by Low-Frequency Noise Measurements

Karatsori, Theano A., Theodorou, Christoforos G., Mescot, Xavier, Haendler, Sebastien, Planes, Nicolas, Ghibaudo, Gerard, Dimitriadis, Charalabos A.

Journal:

IEEE Transactions on Electron Devices

Year:

2016

Language:

english

File:

PDF, 2.11 MB

english, 2016

7

A Lambert-Function Charge-Based Methodology for Extracting Electrical Parameters of Nanoscale FinFETs

Tsormpatzoglou, Andreas, Papathanasiou, Konstantinos, Fasarakis, Nikolaos, Tassis, Dimitrios H., Ghibaudo, Gérard, Dimitriadis, Charalabos A.

Journal:

IEEE Transactions on Electron Devices

Year:

2012

Language:

english

File:

PDF, 508 KB

english, 2012

8

Analytical Drain Current Compact Model in the Depletion Operation Region of Short-Channel Triple-Gate Junctionless Transistors

Oproglidis, Theodoros A., Tsormpatzoglou, Andreas, Tassis, Dimitrios H., Karatsori, Theano A., Barraud, Sylvain, Ghibaudo, Gerard, Dimitriadis, Charalabos A.

Journal:

IEEE Transactions on Electron Devices

Year:

2017

Language:

english

File:

PDF, 1.10 MB

english, 2017

9

Impact of Hot Carrier Aging on the Performance of Triple-Gate Junctionless MOSFETs

Oproglidis, Theodoros A., Karatsori, Theano A., Theodorou, Christoforos G., Tsormpatzoglou, Andreas, Barraud, Sylvain, Ghibaudo, Gerard, Dimitriadis, Charalabos A.

Journal:

IEEE Transactions on Electron Devices

Year:

2020

Language:

english

File:

PDF, 1.37 MB

english, 2020

10

[IEEE ESSDERC 2016 - 46th European Solid-State Device Research Conference - Lausanne, Switzerland (2016.9.12-2016.9.15)] 2016 46th European Solid-State Device Research Conference (ESSDERC) - Noise-induced dynamic variability in nano-scale CMOS SRAM cells

Theodorou, Christoforos G., Fadlallah, Mouenes, Garros, Xavier, Dimitriadis, Charalabos, Ghibaudo, Gerard

Year:

2016

Language:

english

File:

PDF, 3.41 MB

english, 2016

11

[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - New LFN and RTN analysis methodology in 28 and 14nm FD-SOI MOSFETs

Theodorou, Christoforos G., Ioannidis, Eleftherios G., Haendler, Sebastien, Planes, Nicolas, Josse, Emmanuel, Dimitriadis, Charalabos A., Ghibaudo, Gerard

Year:

2015

Language:

english

File:

PDF, 1.44 MB

english, 2015

12

Compact Modeling of Nanoscale Trapezoidal FinFETs

Fasarakis, Nikolaos, Karatsori, Theano A., Tsormpatzoglou, Andreas, Tassis, Dimitrios H., Papathanasiou, Konstantinos, Bucher, Matthias, Ghibaudo, Gerard, Dimitriadis, Charalabos A.

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 4.51 MB

english, 2014

13

Growth mechanism and morphology of semiconducting FeSi2 films

Dimitriadis, Charalabos A., Werner, Jurgen H.

Journal:

Journal of Applied Physics

Year:

1990

Language:

english

File:

PDF, 853 KB

english, 1990

14

The association of the metabolic profile in diabetes mellitus type 2 patients with obsessive-compulsive symptomatology and depressive symptomatology: New insights

Kontoangelos, Konstantinos, Raptis, Athanasios E., Papageorgiou, Charalabos C., Papadimitriou, George N., Rabavilas, Andreas D., Dimitriadis, George, Raptis, Sotirios A.

Journal:

International Journal of Psychiatry in Clinical Practice

Year:

2013

Language:

english

File:

PDF, 105 KB

english, 2013

15

Chaotic Behavior of Random Telegraph Noise in Nanoscale UTBB FD-SOI MOSFETs

Tassis, Dimitrios H., Stavrinides, Stavros G., Hanias, Michael P., Theodorou, Christoforos G., Ghibaudo, Gerard, Dimitriadis, Charalabos A.

Journal:

IEEE Electron Device Letters

Year:

2017

Language:

english

File:

PDF, 4.39 MB

english, 2017

16

Origin of Low-Frequency Noise in Triple-Gate Junctionless n-MOSFETs

Oproglidis, Theodoros A., Karatsori, Theano A., Theodorou, Christoforos G., Tassis, Dimitrios, Barraud, Sylvain, Ghibaudo, Gerard, Dimitriadis, Charalabos A.

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 1.09 MB

english, 2018

17

Low-Frequency Noise Sources in Advanced UTBB FD-SOI MOSFETs

Theodorou, Christoforos G., Ioannidis, Eleftherios G., Andrieu, Francois, Poiroux, Thierry, Faynot, Olivier, Dimitriadis, Charalabos A., Ghibaudo, Gerard

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.21 MB

english, 2014

18

Analytical Modeling of Threshold Voltage and Interface Ideality Factor of Nanoscale Ultrathin Body and Buried Oxide SOI MOSFETs With Back Gate Control

Fasarakis, Nikolaos, Karatsori, Theano, Tassis, Dimitrios H., Theodorou, Christoforos G., Andrieu, Francois, Faynot, Olivier, Ghibaudo, Gerard, Dimitriadis, Charalabos A.

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.51 MB

english, 2014

19

A comprehensive analysis of nanoscale single- and multi-gate MOSFETs

Sharma, Rupendra Kumar, Dimitriadis, Charalabos A., Bucher, Matthias

Journal:

Microelectronics Journal

Year:

2016

Language:

english

File:

PDF, 1.69 MB

english, 2016

20

[IEEE 2013 International Semiconductor Conference Dresden - Grenoble (ISCDG) - Dresden, Germany (2013.09.26-2013.09.27)] 2013 International Semiconductor Conference Dresden - Grenoble (ISCDG) - Variability analysis - prediction method for nanoscale triple gate FinFETs

Tassis, Dimitrios H., Fasarakis, Nikolaos, Dimitriadis, Charalabos A., Ghibaudo, Gerard

Year:

2013

Language:

english

File:

PDF, 1.55 MB

english, 2013

21

Short Channel Effects on LTPS TFT Degradation

Moschou, Despina C., Theodorou, Christoforos G., Hastas, Nikolaos A., Tsormpatzoglou, Andreas, Kouvatsos, Dimitrios N., Voutsas, Apostolos T., Dimitriadis, Charalabos A.

Journal:

Journal of Display Technology

Year:

2013

Language:

english

File:

PDF, 1.65 MB

english, 2013

22

Compact Capacitance Model of Undoped or Lightly Doped Ultra-Scaled Triple-Gate FinFETs

Fasarakis, Nikolaos, Tsormpatzoglou, Andreas, Tassis, Dimitrios H., Pappas, Ilias, Papathanasiou, Konstantinos, Bucher, Matthias, Ghibaudo, Gérard, Dimitriadis, Charalabos A.

Journal:

IEEE Transactions on Electron Devices

Year:

2012

Language:

english

File:

PDF, 296 KB

english, 2012

23

A new method for the determination of the channel length reduction in polysilicon thin film transistors (TFTs)

Filippos V Farmakis, Jean Brini, Georges Kamarinos, Nathalie Mathieu, Charalabos A Dimitriadis

Journal:

Thin Solid Films

Year:

1999

Language:

english

File:

PDF, 248 KB

english, 1999

24

A New Analog Buffer Using Low-Temperature Polysilicon Thin-Film Transistors for Active-Matrix Displays

Ilias Pappas, Stilianos Siskos, Charalabos A. Dimitriadis

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 203 KB

english, 2007

25

Drain-Current Flicker Noise Modeling in nMOSFETs From a 14-nm FDSOI Technology

Ioannidis, Eleftherios G., Theodorou, Christoforos G., Karatsori, Theano A., Haendler, Sebastien, Dimitriadis, Charalabos A., Ghibaudo, Gerard

Journal:

IEEE Transactions on Electron Devices

Year:

2015

Language:

english

File:

PDF, 1.06 MB

english, 2015

26

Characterization and Modeling of NBTI in Nanoscale UltraThin Body UltraThin Box FD-SOI MOSFETs

Karatsori, Theano A., Theodorou, Christoforos G., Haendler, Sebastien, Planes, Nicolas, Ghibaudo, Gerard, Dimitriadis, Charalabos A.

Journal:

IEEE Transactions on Electron Devices

Year:

2016

Language:

english

File:

PDF, 1012 KB

english, 2016

27

All Operation Region Characterization and Modeling of Drain and Gate Current Mismatch in 14-nm Fully Depleted SOI MOSFETs

Karatsori, Theano A., Theodorou, Christoforos G., Josse, Emmanuel, Dimitriadis, Charalabos A., Ghibaudo, G.

Journal:

IEEE Transactions on Electron Devices

Year:

2017

Language:

english

File:

PDF, 1.80 MB

english, 2017

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Z-Library Since 2009 support@1delivery.pm

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски